Non-Raster-Scanning for High Speed AFM
Prof. Sean AnderssonBoston University
Date: Friday, November 2, 2007 at 12:00 PM
Room: PARB 126
Abstract
Atomic force microscopy (AFM) is an invaluable tool for the study of systems with nanometer-scale features. In recent years, the technology is increasingly being used to study dynamics in such systems. Images are built pixel-by-pixel and the time to form a single frame is typically on the order of seconds. This is far slower than the time scale of many important phenomena, severely restricting the applicability of the technology. As a result, there is great interest in improving the effective temporal resolution of the instrument. In this talk we will outline existing approaches to this problem, including the use of modern control theory and novel mechanism designs. We will then focus on our own novel approach: the use of non-raster methods. By utilizing the data coming from the microscope to adjust the measurement process itself, measurements can be made where they are most effective, such as where the sample has spatially or temporally varying features. We will outline the general approach, describe preliminary results, and discuss challenges that must be overcome to realize this imaging technique.
Presenter Bio
Sean B. Andersson is an Assistant Professor of Aerospace and Mechanical Engineering at Boston University. He received the B.S. degree in applied and engineering physics from Cornell University in 1994, the M.S. degree in mechanical engineering from Stanford University in 1995 and the Ph.D. degree in electrical engineering from the University of Maryland, College Park in 2003. From 1995-1996 he worked as a Project Engineer for AlliedSignal Aerospace (Torrance, CA) and from 1996-1998 as a Senior Controls Engineer for Aerovironment, Inc. (Monrovia, CA). From 2003-2006 he was a Lecturer in Applied Mathematics at Harvard University. Dr. Andersson's current research interests include control applications in scanning probe microscopy, robotics, and symbolic control.
